Point detail

General test conditions

The following conditions shall apply to the tested-device:
(a)     The test shall be conducted at an ambient temperature of 20 ± 10 °C;
(b)     At the beginning of the test, the SOC shall be adjusted to a value in the upper 50 per cent of the normal operating SOC range of the tested-device;
(c)     At the beginning of the test, all protection devices which affect the function(s) of the tested-device that are relevant to the outcome of the test shall be operational.