| 3.2. |
Test procedure The tested-device shall be decelerated or, at the choice of the applicant, accelerated in compliance with the acceleration corridors which are specified in Tables 1 to 3. The Technical Service in consultation with the manufacturer shall decide whether the tests shall be conducted in either the positive or negative direction or both. For each of the test pulses specified, a separate tested-device may be used. The test pulse shall be within the minimum and maximum value as specified in Tables 1 to 3. A higher shock level and /or longer duration as described in the maximum value in Tables 1 to 3 can be applied to the tested-device if recommended by the manufacturer. |
a0c0 |