3.1.

General test conditions

The following condition shall apply to the test:
(a)     The test shall be conducted at a ambient temperature of 20 ± 10 °C or at higher temperature if requested by the manufacturer;
(b)     At the beginning of the test, the SOC shall be adjusted to a value in the upper 50 per cent of the normal operating SOC range;
(c)     At the beginning of the test, all protection devices which would affect the function of the tested-device and which are relevant to the outcome of the test shall be operational.

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